发明申请
- 专利标题: LOCALIZED BIASING FOR SILICON ON INSULATOR STRUCTURES
- 专利标题(中): 绝缘子结构中硅的局部偏置
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申请号: US12565294申请日: 2009-09-23
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公开(公告)号: US20100012995A1公开(公告)日: 2010-01-21
- 发明人: Fernando Gonzalez , John K. Zahurak
- 申请人: Fernando Gonzalez , John K. Zahurak
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L29/06
摘要:
A silicon-on-insulator device has a localized biasing structure formed in the insulator layer of the SOI. The localized biasing structure includes a patterned conductor that provides a biasing signal to distinct regions of the silicon layer of the SOI. The conductor is recessed into the insulator layer to provide a substantially planar interface with the silicon layer. The conductor is connected to a bias voltage source. In an embodiment, a plurality of conductor is provided that respectively connected to a plurality of voltage sources. Thus, different regions of the silicon layer are biased by different bias signals.
公开/授权文献
- US08159014B2 Localized biasing for silicon on insulator structures 公开/授权日:2012-04-17
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