发明申请
US20100034355A1 Systems and Methods for Using An Intensity-Modulated X-Ray Source
有权
使用强度调制的X射线源的系统和方法
- 专利标题: Systems and Methods for Using An Intensity-Modulated X-Ray Source
- 专利标题(中): 使用强度调制的X射线源的系统和方法
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申请号: US12484172申请日: 2009-06-12
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公开(公告)号: US20100034355A1公开(公告)日: 2010-02-11
- 发明人: Willem G.J. Langeveld , William A. Johnson , Roger D. Owen , Russell G. Schonberg
- 申请人: Willem G.J. Langeveld , William A. Johnson , Roger D. Owen , Russell G. Schonberg
- 主分类号: H05G1/30
- IPC分类号: H05G1/30 ; G01N23/04
摘要:
The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
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