发明申请
- 专利标题: METHODS OF ERASE VERIFICATION FOR A FLASH MEMORY DEVICE
- 专利标题(中): 闪存存储器件的擦除验证方法
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申请号: US12190409申请日: 2008-08-12
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公开(公告)号: US20100039864A1公开(公告)日: 2010-02-18
- 发明人: Vishal Sarin , Dzung Nguyen , Jonathan Pabustan , Jung Sheng Hoei , Jason Guo , William Saiki
- 申请人: Vishal Sarin , Dzung Nguyen , Jonathan Pabustan , Jung Sheng Hoei , Jason Guo , William Saiki
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G11C16/16
- IPC分类号: G11C16/16 ; G11C8/00
摘要:
Methods and apparatus are disclosed, such as those involving a flash memory device that includes a memory block. The memory block includes a plurality of data lines extending substantially parallel to one another, and a plurality of memory cells. One such method includes erasing the memory cells; and performing erase verification on the memory cells. The erase verification includes determining one memory cell by one memory cell whether the individual memory cells coupled to one of the data lines have been erased. The method can also include performing a re-erase operation that selectively re-erases unerased memory cells based at least partly on the result of the erase verification.
公开/授权文献
- US07835190B2 Methods of erase verification for a flash memory device 公开/授权日:2010-11-16
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