发明申请
- 专利标题: PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
- 专利标题(中): 太阳能电池电气接触探头
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申请号: US12539177申请日: 2009-08-11
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公开(公告)号: US20100045264A1公开(公告)日: 2010-02-25
- 发明人: Jorg KIESEWETTER , Axel BECKER , Michael TEICH , Claus DIETRICH , Hartmut WAUER
- 申请人: Jorg KIESEWETTER , Axel BECKER , Michael TEICH , Claus DIETRICH , Hartmut WAUER
- 申请人地址: DE Sacka
- 专利权人: SUSS MicroTec Test Systems GmbH
- 当前专利权人: SUSS MicroTec Test Systems GmbH
- 当前专利权人地址: DE Sacka
- 优先权: DE102008038186.1-35 20080819
- 主分类号: G01R1/06
- IPC分类号: G01R1/06
摘要:
A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the reference sensor, and a mounting plane to which the tip of the contact element is oriented. The probe ensures a secure electrical contact of the solar cell in a testing station with minimal mechanical stress, and is also suitable for use in an industrial continuous production method.
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