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1.发明申请公开(公告)号：US20220099704A1
公开(公告)日：2022-03-31
申请号：US17310348
申请日：2020-02-25
发明人： Shuguang Wu
摘要： A sensor cable harness for coupling one or more sensors to at least one electrical asset of a power grid, comprises at least one sensor to sense a condition of the at least one electrical asset. At least one signal cable is configured to carry a sensor data signal from the at least one sensor to an electrical analytics unit (EAU). An asset indicator device is provided to at least temporarily couple to the at least one signal cable to indicate the at least one electrical asset being sensed by an assigned port of the EAU.
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公开(公告)号：US10935573B2
公开(公告)日：2021-03-02
申请号：US16145571
申请日：2018-09-28
申请人： Intel Corporation
发明人： Joe Walczyk , Pooya Tadayon
摘要： A device probe includes a primary probe arm and a subsequent probe arm with a slip plane spacing between the primary probe arm and subsequent probe arm. Each probe arm is integrally part of a probe base that is attachable to a probe card. During probe use on a semiconductive device or a semiconductor device package substrate, overtravel of the probe tip allows the primary and subsequent probe arms to deflect, while sufficient resistance to deflection creates a useful contact with an electrical structure such as an electrical bump or a bond pad.
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公开(公告)号：US10908183B2
公开(公告)日：2021-02-02
申请号：US16180561
申请日：2018-11-05
发明人： Mark Whittington
摘要： A novel coupling system may include a head-end circuit for coupling a probe via a cable to an instrument, delivering power to the probe over the cable while the cable carries signal(s) from the probe to the instrument. The head-end circuit may include a first terminal for coupling to the probe via a cable, and may further include a second terminal for coupling to the instrument. The head-end circuit may apply direct-current (DC) power to the cable, and may remove a DC voltage offset resulting from the applied DC power before a signal from the probe reaches the instrument. The head-end circuit may include a common node coupled to the first terminal, a current source coupling the common node to a supply voltage, and a voltage source coupling the common node to a second terminal that couples to the instrument.
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公开(公告)号：US10110326B1
公开(公告)日：2018-10-23
申请号：US15721754
申请日：2017-09-30
发明人： Jukka Kyrolainen , Pekka Kyosti , Lassi Hentila , Aki Hekkala
摘要： An MPAC OTA test system and method are provided that can be used to perform radiated testing of 5G BSs and 5G UEs. The arrangement and number of active probe antennas in the anechoic chamber can be selected based at least in part on a simulation of the channel model of the RC emulator to improve testing while also reducing the overall number of probe antennas that are needed and reducing the channel resources of the RC emulator of the MPAC OTA test system, thereby allowing the overall complexity and cost of the MPAC OTA test system to be reduced.
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公开(公告)号：US09933459B1
公开(公告)日：2018-04-03
申请号：US15400152
申请日：2017-01-06
申请人： Fluke Corporation
CPC分类号： G01R15/125 , G01B3/008 , G01R1/06705
摘要： Systems and methods of providing a magnetically coupled ground reference probe for use with test equipment, such as digital multimeters (DMMs). The magnetically coupled ground reference probes disclosed herein may be used instead of a typical test probe or alligator clip. A magnetically coupled ground reference probe may be provided which includes an insulative housing surrounding a conductive magnet such as a permanent magnet or an electromagnet. The magnet may autonomously retract into a cavity of the insulative housing when not coupled to a ground reference so that the magnet does not contact a high potential source when being handled by the operator. In at least some implementations, at least a portion of the insulation material of the housing may be compressible to allow the magnet to come into physical contact with a ground reference surface while providing a sufficient creepage and clearance path.
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公开(公告)号：US09885749B2
公开(公告)日：2018-02-06
申请号：US15176186
申请日：2016-06-08
CPC分类号： G01R31/2891 , G01L5/0028 , G01L5/0038 , G01R1/06 , G01R1/067 , G01R1/06711 , G01R1/06716 , G01R1/06794 , G01R31/26 , G01R31/2642 , G01R31/2887 , G01R31/2889 , H05K1/0268
摘要： A method in accordance with various embodiments may include: measuring a contact force between at least one probe and at least one contact pad for a plurality of probe overdrive positions, and determining a relationship between contact force and probe overdrive position from the measured contact forces; determining a first region in the relationship exhibiting a non-linear dependence of the contact force from the probe overdrive position, and a second region exhibiting a linear dependence of the contact force from the probe overdrive position; and determining a process window for a pad probing process based on the determined first region and second region.
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公开(公告)号：US09620885B2
公开(公告)日：2017-04-11
申请号：US14035858
申请日：2013-09-24
发明人： Kevin B. Larkin
IPC分类号： G01R1/06 , H01R13/447 , B23P5/00 , H01B1/00 , H01R11/24 , H01R101/00 , G01R1/067 , G01R1/04
CPC分类号： H01R13/447 , B23P5/00 , B23P2700/00 , G01R1/0425 , G01R1/06788 , H01B1/00 , H01R11/24 , H01R2101/00
摘要： An insulator for a test clip is described. The insulator includes a first clip cover configured to removably attach to a top portion of a test clip. The test clip comprises a top portion and a bottom portion pivotally attached to the top portion along a pivot axis. The insulator also comprises a second clip cover configured to removably attach to the bottom portion of the test clip. Each of the first and the second clip cover comprises one or more retaining elements configured to secure the clip cover to its respective portion of the test clip. In some implementations, each of the first and the second clip cover comprises one or more cantilevered retaining segments configured to extend over a portion of the test clip in order to secure the first and the second clip covers to the test clip.
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公开(公告)号：US09583960B2
公开(公告)日：2017-02-28
申请号：US14111636
申请日：2012-04-13
申请人： Kelli Mamadou
发明人： Kelli Mamadou
CPC分类号： H02J7/007 , H01M10/44 , H01M10/441 , H01M10/46
摘要： Method for charging an electrochemical accumulator, comprising a step (E10) of determining the initial state of the electrochemical accumulator, characterized in that it comprises a step (E11) of determining the regime of charge of the electrochemical accumulator by optimizing the product of a charging time saving and an energy saving as a function of the initial state of the electrochemical accumulator.
摘要翻译： 一种用于对电化学蓄电池充电的方法，包括确定电化学蓄电池的初始状态的步骤（E10），其特征在于，其包括通过优化充电产物来确定电化学蓄电池的充电状态的步骤（E11） 作为电化学蓄电池的初始状态的函数的节省时间和节能。
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公开(公告)号：US09274144B2
公开(公告)日：2016-03-01
申请号：US14586000
申请日：2014-12-30
申请人： Paul Nicholas Chait , Stanley Chait
发明人： Paul Nicholas Chait , Stanley Chait
CPC分类号： G01R1/07364 , G01R1/06788
摘要： A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end. When the clamp plunger is depressed, the alligator clamp is extended from the open end and the jaws are urged open by a jaw spring, and when the clamp plunger is released, the compression spring acts to retract the alligator clamp back towards the hollow bore and the jaws are urged closed by contact with the open end. When the point plunger is depressed, the point is extended from the open end. When the clamp plunger is again depressed, the point retracts into the housing.
摘要翻译： 多功能测试仪器探头包括具有开口端的中空孔的壳体。 夹紧柱塞承载在中空孔中，第一端包括拇指按压器，第二端包括具有一对钳口的鳄鱼夹，压缩弹簧通常使拇指按压器远离壳体偏置，并且通常偏置 基本上在靠近开口端的中空孔内的鳄鱼夹。 点柱塞也被承载在孔中，第一端包括拇指按压器，第二端部终止于一点，第二压缩弹簧通常使拇指按压器远离壳体偏置，并且偏压中空部件内的点 靠近开口端。 当夹紧柱塞被压下时，鳄鱼夹从开口端延伸并且夹爪通过卡爪弹簧推动打开，并且当夹紧柱塞被释放时，压缩弹簧用于使鳄鱼夹夹回到空心孔，并且 钳口通过与开口端接触而被关闭。 当点柱塞被压下时，该点从开口端延伸。 当夹紧柱塞再次被压下时，该点缩回到壳体中。
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10.发明授权Semiconductor chip, semiconductor apparatus having the same and method of arranging the same 有权半导体芯片，具有相同的半导体器件及其布置方法公开(公告)号：US09236295B2
公开(公告)日：2016-01-12
申请号：US14013932
申请日：2013-08-29
申请人： SK hynix Inc.
发明人： Young Hee Yoon , Kang Seol Lee
IPC分类号： G01R31/26 , G01R1/06 , H01L21/768 , G11C5/02 , G11C5/06 , H01L21/66 , H01L23/48 , G11C5/04 , G11C8/12 , H01L23/00 , H01L25/065
CPC分类号： H01L21/76877 , G11C5/025 , G11C5/04 , G11C5/063 , G11C8/12 , H01L22/32 , H01L23/481 , H01L24/06 , H01L24/16 , H01L25/0657 , H01L2224/0401 , H01L2224/06136 , H01L2224/16145 , H01L2224/16225 , H01L2225/06513 , H01L2225/06517 , H01L2225/06544
摘要： Provided is a semiconductor apparatus in which a plurality of semiconductor chips stacked in a vertical direction. Each of the semiconductor chips comprises: a bank area comprising a plurality of banks configured to store data; and a peripheral area including a pad area in which a plurality of pads configured to receive signals for controlling the bank area and a plurality of TSV for electrically connecting the plurality of pads, respectively.
摘要翻译： 提供一种半导体装置，其中多个半导体芯片沿垂直方向堆叠。 每个半导体芯片包括：存储区域，其包括被配置为存储数据的多个存储体; 以及包括焊盘区域的周边区域，其中多个焊盘被配置为接收用于控制焊盘区域的信号，以及多个TSV，用于电连接多个焊盘。
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