发明申请
US20100045983A1 Spatially precise optical treatment or measurement of targets through intervening birefringent layers 失效
空间精确的光学处理或通过中间双折射层测量目标

  • 专利标题: Spatially precise optical treatment or measurement of targets through intervening birefringent layers
  • 专利标题(中): 空间精确的光学处理或通过中间双折射层测量目标
  • 申请号: US12196455
    申请日: 2008-08-22
  • 公开(公告)号: US20100045983A1
    公开(公告)日: 2010-02-25
  • 发明人: Fang Huang
  • 申请人: Fang Huang
  • 申请人地址: US CA Hayward
  • 专利权人: OPTISOLAR, INC., A DELAWARE CORPORATION
  • 当前专利权人: OPTISOLAR, INC., A DELAWARE CORPORATION
  • 当前专利权人地址: US CA Hayward
  • 主分类号: G01J4/00
  • IPC分类号: G01J4/00
Spatially precise optical treatment or measurement of targets through intervening birefringent layers
摘要:
A treatment pattern (such as a focused spot, an image, or an interferogram) projected on a treatment target may lose precision if the treatment beam must pass through a birefringent layer before reaching the target. In the general case, the birefringent layer splits the treatment beam into ordinary and extraordinary components, which propagate in different directions and form two patterns, displaced from each other, at the target layer. The degree of birefringence and the orientation of the optic axis, which influence the amount of displacement, often vary between workpieces or between loci on the same workpiece. This invention measures the orientation of the optic axis and uses the data to adjust the treatment beam incidence direction, the treatment beam polarization, or both to superpose the ordinary and extraordinary components into a single treatment pattern at the target, preventing the birefringent layer from causing the pattern to be blurred or doubled.
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