Invention Application
US20100045999A1 OPTICAL PHASE-MODULATION EVALUATING DEVICE 有权
光学相位调制评估装置

  • Patent Title: OPTICAL PHASE-MODULATION EVALUATING DEVICE
  • Patent Title (中): 光学相位调制评估装置
  • Application No.: US12523150
    Application Date: 2008-01-10
  • Publication No.: US20100045999A1
    Publication Date: 2010-02-25
  • Inventor: Takao TanimotoKoji Kawakita
  • Applicant: Takao TanimotoKoji Kawakita
  • Applicant Address: JP Atsugi-shi
  • Assignee: ANRITSU CORPORATION
  • Current Assignee: ANRITSU CORPORATION
  • Current Assignee Address: JP Atsugi-shi
  • Priority: JP2007-007086 20070116; JP2007-288869 20071106
  • International Application: PCT/JP2008/000011 WO 20080110
  • Main IPC: G01J9/02
  • IPC: G01J9/02
OPTICAL PHASE-MODULATION EVALUATING DEVICE
Abstract:
It is an object of the present invention to provide an optical phase modulation evaluating device that can measure and evaluate the precise degree of modulation in phase of an optical phase modulation signal in comparison with the conventionally-known optical phase modulation evaluating device. The optical phase modulation evaluating module includes: a bit delay device located on optical paths of the third and fifth light beams, and adapted to change the length of the optical paths to delay the third and fifth light beams by one bit per second; and an optical phase difference setting means for delaying either or both the ninth and tenth light beams by a designated phase angle which is not equal to zero, the optical phase difference setting means having a light transmissive plate located on an optical path for the ninth light beam, and a light transmissive plate located on an optical path for the tenth light beam.
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