发明申请
US20100048485A1 SUBSTRATES OF N-END RULE UBIQUITYLATION AND METHODS FOR MEASURING THE UBIQUITYLATION OF THESE SUBSTRATE
有权
用于测量这些基板的非均匀性的N端规则UBIQUITYLATION的基板和方法
- 专利标题： SUBSTRATES OF N-END RULE UBIQUITYLATION AND METHODS FOR MEASURING THE UBIQUITYLATION OF THESE SUBSTRATE
- 专利标题（中）： 用于测量这些基板的非均匀性的N端规则UBIQUITYLATION的基板和方法
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申请号： US12606787申请日： 2009-10-27
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公开(公告)号： US20100048485A1公开(公告)日： 2010-02-25
- 发明人: Ilia DAVYDOV , John H. Kenten , Hans Biebuyck , Pankaj Oberoi
- 申请人： Ilia DAVYDOV , John H. Kenten , Hans Biebuyck , Pankaj Oberoi
- 申请人地址： US MD Gaithersburg
- 专利权人： Meso Scale Technologies LLC
- 当前专利权人： Meso Scale Technologies LLC
- 当前专利权人地址： US MD Gaithersburg
- 主分类号： A61K38/16
- IPC分类号： A61K38/16 ; C07K14/00 ; C12Q1/37 ; C40B30/04 ; G01N33/53 ; C12P21/00 ; C12N15/00 ; A61P43/00
摘要：
The present invention relates to methods, compositions, compounds and kits for detecting, measuring and modulating protein ubiquitylation via the N-end rule pathway and for identifying novel substrates, enzymes and modulators of N-end rule ubiquitylation. The present invention also relates to specific substrates of N-end rule ubiquitylation as well as activated fragments of these substrates, proteases that expose N-degrons in these substrates, ubiquitin ligases that ubiquitylate these substrates and inhibitors of the ubiquitylation of these substrates.
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