发明申请
- 专利标题: MULTI-SPOT INVESTIGATION APPARATUS
- 专利标题(中): 多点调查装置
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申请号: US11721392申请日: 2005-12-13
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公开(公告)号: US20100051788A1公开(公告)日: 2010-03-04
- 发明人: Derk Jan Wilfred Klunder , Maarten Van Herpen , Marcello Balistreri , Menno Prins
- 申请人: Derk Jan Wilfred Klunder , Maarten Van Herpen , Marcello Balistreri , Menno Prins
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP04106680.4 20041217
- 国际申请: PCT/IB2005/054207 WO 20051213
- 主分类号: G01J1/58
- IPC分类号: G01J1/58 ; H01J40/02 ; G01N21/00
摘要:
The invention relates to a method and an apparatus for the investigation of a sample material that is stored in the sample chamber (303) of a storage unit (300). A multi-spot generator MSG (100) and a transmission section (200) generate an array of sample light spots (501) within the sample chamber. Input light (504) that leaves the storage unit (300) in forward direction is mapped onto a CCD array (401) and measured as reference. Moreover, fluorescence light (500) that is stimulated in the sample chamber (303) is measured by a second CCD array which is disposed perpendicular to the optical path of the input light (504).
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