发明申请
US20100058111A1 ABNORMALITY DETECTION METHOD FOR ELECTRONIC DEVICE CONNECTED BY LOOP, AND ELECTRONIC DEVICE 审中-公开
用于通过环路连接的电子设备的异常检测方法和电子设备

  • 专利标题: ABNORMALITY DETECTION METHOD FOR ELECTRONIC DEVICE CONNECTED BY LOOP, AND ELECTRONIC DEVICE
  • 专利标题(中): 用于通过环路连接的电子设备的异常检测方法和电子设备
  • 申请号: US12467791
    申请日: 2009-05-18
  • 公开(公告)号: US20100058111A1
    公开(公告)日: 2010-03-04
  • 发明人: Tomohiro Kobayashi
  • 申请人: Tomohiro Kobayashi
  • 申请人地址: JP Kawasaki-shi
  • 专利权人: FUJITSU LIMITED
  • 当前专利权人: FUJITSU LIMITED
  • 当前专利权人地址: JP Kawasaki-shi
  • 优先权: JP2008-218136 20080827
  • 主分类号: G06F11/26
  • IPC分类号: G06F11/26 G06F11/263
ABNORMALITY DETECTION METHOD FOR ELECTRONIC DEVICE CONNECTED BY LOOP, AND ELECTRONIC DEVICE
摘要:
An electronic device is connected to a loop transmission line via a bypass circuit and detects being bypassed from the loop transmission line. Each electronic device connected to a looped transmission line via each bypass circuit receives a positioning map in which an own address is registered, and judges whether the own address is still registered. The electronic device can judge whether this electronic device is being bypassed from the loop transmission line by the bypass circuit using a conventional sequence.
信息查询
0/0