发明申请
- 专利标题： SCANNING PROBE EPITAXY
- 专利标题（中）： 扫描探头外观
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申请号： US12465616申请日： 2009-05-13
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公开(公告)号： US20100071098A1公开(公告)日： 2010-03-18
- 发明人: Chad A. Mirkin , Chang Liu , Yuhuang Wang , Adam B. Braunschweig , Xing Liao , Louise R. Giam , Byung Y. Lee , Shifeng Li , Joseph S. Fragala , Albert K. Henning
- 申请人： Chad A. Mirkin , Chang Liu , Yuhuang Wang , Adam B. Braunschweig , Xing Liao , Louise R. Giam , Byung Y. Lee , Shifeng Li , Joseph S. Fragala , Albert K. Henning
- 申请人地址： US IL Evanston US IL Skokie
- 专利权人： NORTHWESTERN UNIVERSITY,Nanolnk, Inc.
- 当前专利权人： NORTHWESTERN UNIVERSITY,Nanolnk, Inc.
- 当前专利权人地址： US IL Evanston US IL Skokie
- 主分类号： G01Q60/00
- IPC分类号： G01Q60/00
摘要：
A dual tip probe for scanning probe epitaxy is disclosed. The dual tip probe includes first and second tips disposed on a cantilever arm. The first and second tips can be a reader tip and a synthesis tip, respectively. The dual tip probe further includes a rib disposed on the cantilever arm between the first and second tips. The dual tip probe can also include a strain gauge disposed along the length of the cantilever arm.
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