发明申请
- 专利标题： Over-temperature detecting circuit with high precision
- 专利标题（中）： 超温检测电路精度高
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申请号： US12275228申请日： 2008-11-21
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公开(公告)号： US20100073071A1公开(公告)日： 2010-03-25
- 发明人: Mao-Chuan Chien , Shun-Hau Kao
- 申请人： Mao-Chuan Chien , Shun-Hau Kao
- 优先权： TW097136830 20080925
- 主分类号： H01L37/00
- IPC分类号： H01L37/00
摘要：
An over-temperature detecting circuit includes a band-gap circuit for generating a temperature-drop-dependent voltage and a reference voltage not varying with the temperature, a transistor coupled to the band-gap circuit for generating a temperature-rise-dependent current according to the temperature-drop-dependent voltage, a resistor coupled to the transistor for generating a temperature-rise-dependent voltage according to the temperature-rise-dependent current, and a comparator coupled to the band-gap circuit and the resistor for generating a thermal shutdown signal according to the reference voltage and the temperature-rise-dependent voltage.
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IPC分类:
