发明申请
- 专利标题： Test Method
- 专利标题（中）： 测试方法
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申请号： US12625174申请日： 2009-11-24
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公开(公告)号： US20100074405A1公开(公告)日： 2010-03-25
- 发明人: Junichi Saito , Hailong Cui
- 申请人： Junichi Saito , Hailong Cui
- 申请人地址： JP Tokyo
- 专利权人： Toppan Printing Co., Ltd.
- 当前专利权人： Toppan Printing Co., Ltd.
- 当前专利权人地址： JP Tokyo
- 优先权： JP2008-010300 20080121; JP2008-531053 20080215
- 主分类号： G01N23/223
- IPC分类号： G01N23/223 ; G01N21/00
摘要：
To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a second test step of testing whether the foreign material includes the metal element at the position detected in the first test step.
公开/授权文献
- US07852982B2 Test method 公开/授权日：2010-12-14
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