- 专利标题： INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS
- 专利标题（中）： 电气缺陷光伏检测
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申请号： US12631260申请日： 2009-12-04
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公开(公告)号： US20100079147A1公开(公告)日： 2010-04-01
- 发明人: George H. Zapalac, Jr. , Kirk J. Bertsche , David L. Brown , J. Kirkwood H. Rough , David A. Soltz , Yehiel Gotkis
- 申请人： George H. Zapalac, Jr. , Kirk J. Bertsche , David L. Brown , J. Kirkwood H. Rough , David A. Soltz , Yehiel Gotkis
- 申请人地址： US CA Milpitas
- 专利权人： KLA-TENCOR CORPORATION
- 当前专利权人： KLA-TENCOR CORPORATION
- 当前专利权人地址： US CA Milpitas
- 主分类号： G01R31/08
- IPC分类号： G01R31/08 ; G01R31/00
摘要：
A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.
公开/授权文献
- US07906972B2 Inline inspection of photovoltaics for electrical defects 公开/授权日：2011-03-15
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