公开(公告)号：US07560703B1

公开(公告)日：2009-07-14

申请号：US11772301

申请日：2007-07-02

申请人： David A. Soltz ,  Ye Yang ,  Mark C. Lin ,  Laurence S. Horndon ,  Edward G. Solomon ,  Joseph A. Heanue ,  John F. Heanue ,  M. Nasser Ghodsi

发明人： David A. Soltz ,  Ye Yang ,  Mark C. Lin ,  Laurence S. Horndon ,  Edward G. Solomon ,  Joseph A. Heanue ,  John F. Heanue ,  M. Nasser Ghodsi

IPC分类号： H01J37/244

CPC分类号： H01J37/244 ,  H01J37/28 ,  H01J2237/2443

摘要： A signal conduction channel having a first element that receives electrons at a first end from a vacuum environment, produces photons as the electrons are received, and propagates the photons along a length of the first element to a distal second end, and a second element that receives the photons from the second end of the first element, converts the photons to electrons, and multiplies the electrons, where no additional element is disposed between the second end of the first element and the second element, except optionally at least one of a photon-conductive epoxy, a lens, and an optical coupling plate that touches both the second end of the first element and the second element.

摘要翻译： 具有从真空环境在第一端接收电子的第一元件的信号传导通道在接收电子时产生光子，并且沿着第一元件的长度将光子传播到远端第二端，以及第二元件， 从第一元件的第二端接收光子，将光子转换成电子，并乘以电子，其中在第一元件的第二端和第二元件之间没有额外的元件被设置，除了可选地，至少一个光子 导电环氧树脂，透镜和接触第二元件和第二元件的第二端的光耦合板。

公开(公告)号：US06936816B2

公开(公告)日：2005-08-30

申请号：US10833611

申请日：2004-04-28

申请人： Marian Mankos ,  David A. Soltz ,  Harald F. Hess

发明人： Marian Mankos ,  David A. Soltz ,  Harald F. Hess

IPC分类号： G01N23/20 ,  G01N23/22 ,  G01N23/225 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q70/00 ,  G11B5/012 ,  G11B5/09 ,  G11B5/127 ,  G11B5/31 ,  G11B5/455 ,  G11B9/10

CPC分类号： G01N23/20 ,  G01N23/22 ,  G01N23/225 ,  G01N23/2251 ,  G11B5/012 ,  G11B5/09 ,  G11B5/1272 ,  G11B5/3166 ,  G11B5/3193 ,  G11B5/455

摘要： One embodiment disclosed relates to a method for inspecting or reviewing a magnetized specimen using an automated inspection apparatus. The method includes generating a beam of incident electrons using an electron source, biasing the specimen with respect to the electron source such that the incident electrons decelerate as a surface of the specimen is approached, and illuminating a portion of the specimen at a tilt with the beam of incident electrons. The specimen is moved under the incident beam of electrons using a movable stage of the inspection apparatus. Scattered electrons are detected to form image data of the specimen showing distinct contrast between regions of different magnetization. The movement of the specimen under the beam of incident electrons may be continuous, and data for multiple image pixels may be acquired in parallel using a time delay integrating detector.

摘要翻译： 所公开的一个实施例涉及使用自动检查装置检查或检查磁化试样的方法。 该方法包括使用电子源产生入射电子束，使样本相对于电子源偏置，使得入射的电子随着试样的表面而减速，并且以一定的倾斜度照射一部分试样 入射电子束。 使用检查装置的可移动台，使试样在电子的入射光束下移动。 检测到分散的电子以形成不同磁化强度的区域之间显示不同对比度的样本的图像数据。 在入射电子束下的样本的移动可以是连续的，并且可以使用时间延迟积分检测器并行获取多个图像像素的数据。

公开(公告)号：US08427185B2

公开(公告)日：2013-04-23

申请号：US13024379

申请日：2011-02-10

申请人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

发明人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

IPC分类号： G01R31/308 ,  G01R31/08

CPC分类号： H02S50/10

摘要： A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

摘要翻译： 一种用于电气异常的光伏材料的在线检查方法。 第一电连接形成在光伏材料的第一表面上，并且第二电连接形成在光伏材料的相对的第二表面上。 在光伏材料中感应到局部电流，并且使用第一和第二电连接来感测光伏材料中局部电流的特性。 分析感测到的局部电流的性质以检测光伏材料中的电气异常。

公开(公告)号：US07115866B1

公开(公告)日：2006-10-03

申请号：US11116617

申请日：2005-04-28

申请人： Roger Kroeze ,  David A. Soltz ,  David A. Crewe ,  Gregory W. Grant ,  Chiyan Kuan ,  Thierry H. C. Nguyen ,  Salvatore T. Fahey ,  Edward M. James

发明人： Roger Kroeze ,  David A. Soltz ,  David A. Crewe ,  Gregory W. Grant ,  Chiyan Kuan ,  Thierry H. C. Nguyen ,  Salvatore T. Fahey ,  Edward M. James

IPC分类号： G21K7/00 ,  G01N23/00

CPC分类号： G01N23/2252 ,  H01J37/252 ,  H01J37/265 ,  H01J2237/24592 ,  H01J2237/2487 ,  H01J2237/2561 ,  H01J2237/30477

摘要： A method of measuring properties of a sample using an electron beam. Coordinates of a measurement site on the sample, and a diameter of the electron beam are defined. Multiple measurement locations are determined within the measurement site, using the coordinates of the measurement site and the diameter of the electron beam. The measurement locations are selected such that the electron beam when directed at the multiple measurement locations (either through beam deflection or sample movement) substantially covers the measurement site. The electron beam is directed to the measurement locations and properties of the sample are measured at each of the measurement locations.

摘要翻译： 使用电子束测量样品的性质的方法。 定义样品上的测量部位的坐标和电子束的直径。 使用测量部位的坐标和电子束的直径，在测量部位内确定多个测量位置。 选择测量位置使得当指向​​多个测量位置（通过光束偏转或样品移动）时的电子束基本上覆盖测量位置。 电子束被引导到测量位置，并且在每个测量位置处测量样品的性质。

公开(公告)号：US06759654B1

公开(公告)日：2004-07-06

申请号：US10345696

申请日：2003-01-16

申请人： Marian Mankos ,  David A. Soltz ,  Harald F. Hess

发明人： Marian Mankos ,  David A. Soltz ,  Harald F. Hess

IPC分类号： G01N23225

CPC分类号： G11B5/455 ,  G01N23/2251 ,  G11B5/012 ,  G11B5/09 ,  G11B5/1272 ,  G11B5/3166 ,  G11B5/3193 ,  G11B27/36 ,  G11B2220/20

摘要： One embodiment disclosed relates to a method for inspecting or reviewing a magnetized specimen using an automated inspection apparatus. The method includes generating a beam of incident electrons using an electron source, biasing the specimen with respect to the electron source such that the incident electrons decelerate as a surface of the specimen is approached, and illuminating a portion of the specimen at a tilt with the beam of incident electrons. The specimen is moved under the incident beam of electrons using a movable stage of the inspection apparatus. Scattered electrons are detected to form image data of the specimen showing distinct contrast between regions of different magnetization. The movement of the specimen under the beam of incident electrons may be continuous, and data for multiple image pixels may be acquired in parallel using a time delay integrating detector.

公开(公告)号：US20110133750A1

公开(公告)日：2011-06-09

申请号：US13024379

申请日：2011-02-10

申请人： George H. Zapalac, JR. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

发明人： George H. Zapalac, JR. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

IPC分类号： G01R31/02

CPC分类号： H02S50/10

摘要： A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

摘要翻译： 一种用于电气异常的光伏材料的在线检查方法。 第一电连接形成在光伏材料的第一表面上，并且第二电连接形成于光伏材料的相对的第二表面。 在光伏材料中感应到局部电流，并且使用第一和第二电连接来感测光伏材料中局部电流的特性。 分析感测到的局部电流的性质以检测光伏材料中的电气异常。

公开(公告)号：US07906972B2

公开(公告)日：2011-03-15

申请号：US12631260

申请日：2009-12-04

申请人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

发明人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

IPC分类号： G01R31/08 ,  G01R31/26

CPC分类号： H02S50/10

摘要： A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

摘要翻译： 一种用于电气异常的光伏材料的在线检查方法。 第一电连接形成在光伏材料的第一表面上，并且第二电连接形成在光伏材料的相对的第二表面上。 在光伏材料中感应到局部电流，并且使用第一和第二电连接来感测光伏材料中局部电流的特性。 分析感测到的局部电流的性质以检测光伏材料中的电气异常。

公开(公告)号：US20100079147A1

公开(公告)日：2010-04-01

申请号：US12631260

申请日：2009-12-04

申请人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

发明人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

IPC分类号： G01R31/08 ,  G01R31/00

CPC分类号： H02S50/10

摘要： A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

摘要翻译： 一种用于电气异常的光伏材料的在线检查方法。 第一电连接形成在光伏材料的第一表面上，并且第二电连接形成于光伏材料的相对的第二表面。 在光伏材料中感应到局部电流，并且使用第一和第二电连接来感测光伏材料中局部电流的特性。 分析感测到的局部电流的性质以检测光伏材料中的电气异常。

公开(公告)号：US07649365B1

公开(公告)日：2010-01-19

申请号：US11690809

申请日：2007-03-24

申请人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

发明人： George H. Zapalac, Jr. ,  Kirk J. Bertsche ,  David L. Brown ,  J. Kirkwood H. Rough ,  David A. Soltz ,  Yehiel Gotkis

IPC分类号： G01R31/302 ,  G01R31/08

CPC分类号： H02S50/10

摘要： A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

摘要翻译： 一种用于电气异常的光伏材料的在线检查方法。 第一电连接形成在光伏材料的第一表面上，并且第二电连接形成在光伏材料的相对的第二表面上。 在光伏材料中感应到局部电流，并且使用第一和第二电连接来感测光伏材料中局部电流的特性。 分析感测到的局部电流的性质以检测光伏材料中的电气异常。