发明申请
- 专利标题: CHARACTERIZING A COMPUTER SYSTEM USING A PATTERN-RECOGNITION MODEL
- 专利标题(中): 使用模式识别模型表征计算机系统
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申请号: US12240211申请日: 2008-09-29
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公开(公告)号: US20100082299A1公开(公告)日: 2010-04-01
- 发明人: Ramakrishna C. Dhanekula , Keith A. Whisnant , Kenny C. Gross
- 申请人: Ramakrishna C. Dhanekula , Keith A. Whisnant , Kenny C. Gross
- 申请人地址: US CA Santa Clara
- 专利权人: SUN MICROSYSTEMS, INC.
- 当前专利权人: SUN MICROSYSTEMS, INC.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G06F15/00
- IPC分类号: G06F15/00
摘要:
Some embodiments of the present invention provide a system that characterizes a computer system using a pattern-recognition model. First, values for an environmental parameter are monitored from a set of sensors associated with the computer system. Then, a baseline for the environmental parameter is calculated based on the monitored values from a subset of the set of sensors. Next, the baseline is subtracted from the monitored values from sensors in the set of sensors to produce compensated values. Then, the compensated values are used as inputs to the pattern-recognition model, which produces estimates for the compensated values based on correlations between the compensated values learned during a training phase. Next, residuals are calculated by subtracting the estimates for the compensated values from the compensated values. Then, the residuals are analyzed to characterize the computer system.
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