Invention Application
- Patent Title: PARTICLE MEASURING DEVICE AND PARTICLE SIZE MEASURE DEVICE
- Patent Title (中): 颗粒测量装置和颗粒尺寸测量装置
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Application No.: US12595348Application Date: 2008-04-08
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Publication No.: US20100110177A1Publication Date: 2010-05-06
- Inventor: Yukio Yamada , Shinpei Okawa , Taisuke Hirono
- Applicant: Yukio Yamada , Shinpei Okawa , Taisuke Hirono
- Priority: JP2007-104901 20070412; JP2007-104931 20070412
- International Application: PCT/JP2008/056939 WO 20080408
- Main IPC: H04N7/18
- IPC: H04N7/18
Abstract:
Particles flowed through a micro-channel are imaged by imaging means. Particle speed measuring means determines the particle speed from the image data. Particle counting means counts the particles flowed for a predetermined time. Particle size measuring means measures the size of the particles. The measurements of the particles flowed at a predetermined timing are managed by data associating means. With this, the speed, number and size of particles flowed through a micro-channel can be determined at a time, and associated data can be obtained.
Public/Granted literature
- US08218132B2 Particle measuring device and particle size measure device Public/Granted day:2012-07-10
Information query
