发明申请
- 专利标题： Specimen processing system and specimen container classifying apparatus
- 专利标题（中）： 样品处理系统和样品容器分类装置
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申请号： US12589848申请日： 2009-10-28
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公开(公告)号： US20100111767A1公开(公告)日： 2010-05-06
- 发明人: Yasuo Yonekura , Yuichiro Ohmae , Tokihiro Kosaka , Takaaki Nagai
- 申请人： Yasuo Yonekura , Yuichiro Ohmae , Tokihiro Kosaka , Takaaki Nagai
- 专利权人： Sysmex Corporation
- 当前专利权人： Sysmex Corporation
- 优先权： JP2008-280579 20081030; JP2008-280580 20081030
- 主分类号： G01N35/02
- IPC分类号： G01N35/02 ; G01N33/48 ; G01N33/49 ; G01N33/50
摘要：
A specimen processing system comprising: a specimen measuring section for measuring specimens accommodated in specimen containers; a transport section for transporting specimen containers to the specimen measuring section; a specimen container collect section for collecting specimen containers; an obtainer for obtaining shape information on specimen containers or state information on specimens accommodated in specimen containers; a supply judger configured for determining whether specimen containers are to be supplied to the specimen measuring section on the basis of the result obtained by the obtainer; and a delivery section for delivering specimen containers, which are determined to be supplied to the specimen measuring section by the supply judger, toward the transport section, and delivering specimen containers, which are determined not to be supplied to the specimen measuring section by the supply judger, toward the specimen container collect section, is disclosed. A specimen container classifying apparatus is also disclosed.