发明申请
- 专利标题: METHOD FOR FORMING A MEMORY ARRAY
- 专利标题(中): 形成记忆阵列的方法
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申请号: US12263091申请日: 2008-10-31
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公开(公告)号: US20100112797A1公开(公告)日: 2010-05-06
- 发明人: I-Chen Yang , Yao-Wen Chang , Tao-Cheng Lu
- 申请人: I-Chen Yang , Yao-Wen Chang , Tao-Cheng Lu
- 申请人地址: TW Hsinchu
- 专利权人: MACRONIX INTERNATIONAL CO., LTD.
- 当前专利权人: MACRONIX INTERNATIONAL CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L21/3205
- IPC分类号: H01L21/3205
摘要:
The invention is directed to a method for forming a memory array. The method comprises steps of providing a substrate having a charge trapping structure formed thereon. A patterned material layer is formed over the substrate and the patterned material layer having a plurality of trenches expose a portion of the charge trapping structure. Furthermore, a plurality of conductive spacers are formed on the sidewalls of the trenches of the patterned material layer respectively and a portion of the charge trapping structure at the bottom of the trenches is exposed by the conductive spacers. An insulating layer is formed over the substrate to fill up the trenches of the patterned material layer. Moreover, a planarization process is performed to remove a portion of the insulating layer until a top surface of the patterned material layer and a top surface of each of the conductive spacers are exposed.
公开/授权文献
- US07799638B2 Method for forming a memory array 公开/授权日:2010-09-21
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