发明申请
US20100119040A1 RADIATION DETECTION DEVICE, RADIATION IMAGE ACQUIRING SYSTEM, AND METHOD FOR DETECTING RADIATION
有权
辐射检测装置,辐射图像获取系统和用于检测辐射的方法
- 专利标题: RADIATION DETECTION DEVICE, RADIATION IMAGE ACQUIRING SYSTEM, AND METHOD FOR DETECTING RADIATION
- 专利标题(中): 辐射检测装置,辐射图像获取系统和用于检测辐射的方法
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申请号: US12615675申请日: 2009-11-10
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公开(公告)号: US20100119040A1公开(公告)日: 2010-05-13
- 发明人: Toshiyasu Suyama , Tadashi Maruno , Toshihide Sasaki , Junichi Sonoda , Shinji Takihi
- 申请人: Toshiyasu Suyama , Tadashi Maruno , Toshihide Sasaki , Junichi Sonoda , Shinji Takihi
- 申请人地址: JP Hamamatsu-shi
- 专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人地址: JP Hamamatsu-shi
- 优先权: JPP2008-288924 20081111
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.
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