发明申请
- 专利标题: X-ray radiation detector for use in a CT system
- 专利标题(中): 用于CT系统的X射线辐射检测器
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申请号: US12591577申请日: 2009-11-24
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公开(公告)号: US20100127182A1公开(公告)日: 2010-05-27
- 发明人: Peter Hackenschmied , Christian Schröter , Matthias Strassburg
- 申请人: Peter Hackenschmied , Christian Schröter , Matthias Strassburg
- 优先权: DE102008059678.7 20081125; DE102009018877.0 20090424
- 主分类号: H01L31/0296
- IPC分类号: H01L31/0296 ; H01L31/0272
摘要:
At least one embodiment of the invention relates to an X-ray radiation detector, in particular for use in a CT system. In at least one embodiment, the X-ray radiation detector includes a semiconductor material used for detection, at least two ohmic contacts between the semiconductor material and a contact material, the semiconductor material and contact material each having a specific excitation energy of the charge carriers, with the excitation energy of the contact material corresponding to the excitation energy of the semiconductor material. At least one embodiment of the invention furthermore relates to a CT system in which an X-ray radiation detector is used, the X-ray radiation detector advantageously having at least two ideal ohmic contacts according to at least one embodiment of the invention.
公开/授权文献
- US08445854B2 X-ray radiation detector for use in a CT system 公开/授权日:2013-05-21
信息查询
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