发明申请
- 专利标题: RESISTANCE-CHANGE MEMORY DEVICE
- 专利标题(中): 电阻变化存储器件
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申请号: US12629660申请日: 2009-12-02
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公开(公告)号: US20100135068A1公开(公告)日: 2010-06-03
- 发明人: Minoru Ikarashi , Yutaka Higo , Masanori Hosomi , Hiroshi Kano , Shinichiro Kusunoki , Hiroyuki Ohmori , Yuki Oishi , Tetsuya Yamamoto , Kazutaka Yamane
- 申请人: Minoru Ikarashi , Yutaka Higo , Masanori Hosomi , Hiroshi Kano , Shinichiro Kusunoki , Hiroyuki Ohmori , Yuki Oishi , Tetsuya Yamamoto , Kazutaka Yamane
- 申请人地址: JP Tokyo
- 专利权人: SONY CORPORATION
- 当前专利权人: SONY CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-309039 20081203
- 主分类号: G11C11/02
- IPC分类号: G11C11/02 ; H01L43/00
摘要:
A resistance-change memory device is provided and includes a stack constituting a tunnel magnetoresistance effect element that has a magnetic layer in which a direction of magnetization is switchable and that is formed on a conductive layer, and the stack is included in a resistance-change memory cell performing data writing utilizing a spin transfer effect caused by current injection. The stack is formed such that a line connecting centers of respective layers of the stack is tilted with respect to a direction perpendicular to a surface of the conductive layer having the stack formed thereon.
公开/授权文献
- US08072789B2 Resistance-change memory device 公开/授权日:2011-12-06
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