发明申请
- 专利标题: TEST APPARATUS AND TEST METHOD
- 专利标题(中): 测试装置和测试方法
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申请号: US12569806申请日: 2009-09-29
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公开(公告)号: US20100142393A1公开(公告)日: 2010-06-10
- 发明人: Shinichi ISHIKAWA , Masaru GOISHI , Hiroyasu Nakayama , Masaru Tsuto
- 申请人: Shinichi ISHIKAWA , Masaru GOISHI , Hiroyasu Nakayama , Masaru Tsuto
- 申请人地址: JP Tokyo
- 专利权人: ADVANTEST CORPORATION
- 当前专利权人: ADVANTEST CORPORATION
- 当前专利权人地址: JP Tokyo
- 主分类号: H04L12/26
- IPC分类号: H04L12/26
摘要:
There is provided a test apparatus for testing a device under test, including a receiving section that receives a packet from the device under test, a packet data sequence storing section that stores a data sequence included in each type of packet and received data included in the packet received by the receiving section, a transmission data processing section that reads data from the packet data sequence storing section and generates a test data sequence by adjusting a predetermined portion of a data sequence of a packet to be transmitted to the device under test to have a value corresponding to the received data, and a transmitting section that transmits the test data sequence generated by the transmission data processing section to the device under test.
公开/授权文献
- US08483073B2 Test apparatus and test method 公开/授权日:2013-07-09
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