发明申请
US20100165325A1 OPTICAL SYSTEM FOR A PARTICLE ANALYZER AND PARTICLE ANALYZER USING SAME 有权
用于粒子分析仪和颗粒分析仪的光学系统

  • 专利标题: OPTICAL SYSTEM FOR A PARTICLE ANALYZER AND PARTICLE ANALYZER USING SAME
  • 专利标题(中): 用于粒子分析仪和颗粒分析仪的光学系统
  • 申请号: US12720201
    申请日: 2010-03-09
  • 公开(公告)号: US20100165325A1
    公开(公告)日: 2010-07-01
  • 发明人: Seiichiro Tabata
  • 申请人: Seiichiro Tabata
  • 专利权人: SYSMEX Corporation
  • 当前专利权人: SYSMEX Corporation
  • 优先权: JP2006-209263 20060731
  • 主分类号: G01N21/47
  • IPC分类号: G01N21/47 G01N33/49
OPTICAL SYSTEM FOR A PARTICLE ANALYZER AND PARTICLE ANALYZER USING SAME
摘要:
A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector for receiving the scattered light from the particles, a light shielding member for blocking the direct light from the light source from impinging the photodetector, and a detecting lens for directing the scattered light toward the photodetector, wherein the irradiation optical system forms a first focus that focuses the light from the light source on the particle passing through the flow cell, and forms a second focus that focuses the light from the light source at a position between the detecting lens and photodetector, and disposes the light shielding member at the position of the second focus.
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