Invention Application
US20100165781A1 INTERNAL WRITE/READ PULSE GENERATING CIRCUIT OF A SEMICONDUCTOR MEMORY APPARATUS 有权
半导体内存装置的内部写/读脉冲发生电路

  • Patent Title: INTERNAL WRITE/READ PULSE GENERATING CIRCUIT OF A SEMICONDUCTOR MEMORY APPARATUS
  • Patent Title (中): 半导体内存装置的内部写/读脉冲发生电路
  • Application No.: US12480938
    Application Date: 2009-06-09
  • Publication No.: US20100165781A1
    Publication Date: 2010-07-01
  • Inventor: SANG HEE LEE
  • Applicant: SANG HEE LEE
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Priority: KR10-2008-0136423 20081230
  • Main IPC: G11C8/18
  • IPC: G11C8/18 G11C7/00
INTERNAL WRITE/READ PULSE GENERATING CIRCUIT OF A SEMICONDUCTOR MEMORY APPARATUS
Abstract:
A control clock generating unit outputs a clock as a control clock when a column address strobe pulse is input and fixes the control clock to a specific level when an all bank precharge signal or a refresh signal is enabled. An internal pulse generating unit outputs an external write pulse or an external read pulse as an internal write pulse or an internal read pulse in response to the control clock.
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