发明申请
US20100174958A1 Test circuit including tap controller selectively outputting test signal based on mode and shift signals
失效
测试电路包括抽头控制器，选择性地输出基于模式和移位信号的测试信号
- 专利标题： Test circuit including tap controller selectively outputting test signal based on mode and shift signals
- 专利标题（中）： 测试电路包括抽头控制器，选择性地输出基于模式和移位信号的测试信号
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申请号： US12654801申请日： 2010-01-05
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公开(公告)号： US20100174958A1公开(公告)日： 2010-07-08
- 发明人: Toshiyuki Maeda , Yoshiyuki Nakamura
- 申请人： Toshiyuki Maeda , Yoshiyuki Nakamura
- 申请人地址： JP Kawasaki
- 专利权人： NEC ELECTRONICS CORPORATION
- 当前专利权人： NEC ELECTRONICS CORPORATION
- 当前专利权人地址： JP Kawasaki
- 优先权： JP2009-000743 20090106
- 主分类号： G01R31/3177
- IPC分类号： G01R31/3177 ; G06F11/25 ; G06F11/27
摘要：
A test circuit includes a plurality of TAP controllers conforming to a standard specification defined in IEEE 1149 and includes a master TAP controller which receives a control code and a test control signal and performs a test on a circuit to be tested and which outputs a shift mode signal, a first slave TAP controller which receives the control code and the test control signal and performs a test on a circuit to be tested, and a first TAP pin control circuit provided to correspond to the first slave TAP controller and which switches between inputting the control code to the first slave TAP controller from the outside and inputting the control code through the master TAP controller, on the basis of the shift mode signal.