Abstract:
An inverter circuit (120) is configured so as to perform synchronous rectification by six switching elements (130). The switching element (130) is formed of an unipolar device (SiC MOSFET in this case) using a wideband gap semiconductor. The inverter circuit (120) uses the body diode (131) of SiC MOSFET (130) as a freewheeling diode during synchronous rectification.
Abstract:
A refrigeration apparatus includes a refrigerant circuit with a compressor, a power module, a refrigerant cooler in contact with the power module, and an IPM motor which drives the compressor. A refrigerant in the refrigerant circuit flows through the refrigerant cooler, and cooling of the power module is performed by dissipating heat to the refrigerant flowing in the refrigerant cooler. A controller in the refrigeration apparatus outputs a driving signal to a drive circuit to reduce the number of switching operations of switching elements by performing overmodulation control such that there exists a carrier cycle in which no switching is performed.
Abstract:
A power conversion apparatus is equipped with switching devices to perform power conversion of input AC power supplied from an AC power supply to output AC power having a predetermined voltage and a predetermined frequency, and to supply the power to a motor connected thereto. The apparatus includes a controller controlling switching of the switching devices, a capacitor smoothing a ripple generated by the switching of the switching devices, a current controller controlling a current flowing to the motor, and a voltage distortion corrector detecting a harmonic component caused by distortion in motor input power, and superimposing compensation values on an output of the current controller in accordance with a value of the harmonic component.
Abstract:
A power conversion apparatus is equipped with switching devices to perform power conversion of input AC power supplied from an AC power supply to output AC power having a predetermined voltage and a predetermined frequency, and to supply the power to a motor connected thereto. The apparatus includes a controller controlling switching of the switching devices, a capacitor smoothing a ripple generated by the switching of the switching devices, a current controller controlling a current flowing to the motor, and a voltage distortion corrector detecting a harmonic component caused by distortion in motor input power, and superimposing compensation values on an output of the current controller in accordance with a value of the harmonic component.
Abstract:
The power converter includes a diode rectifier which rectifies alternating current power output from an alternating current power supply, a reactor provided between the alternating current power supply and the diode rectifier, an inverter circuit to which power output from the diode rectifier is directly supplied, and a capacitor provided between power supply lines on a primary side of the diode rectifier.
Abstract:
A scan electrode driving circuit applies a rising ramp waveform voltage to scan electrodes (SCN1 to SCNn) to generate a first setup discharge in a first period within a setup period, applies a dropping ramp waveform voltage to the scan electrodes (SCN1 to SCNn) to generate a second setup discharge in a second period following the first period within the setup period, and applies a first positive rectangular waveform voltage (Vs), a negative rectangular waveform voltage (Va), a second positive rectangular waveform voltage (Vs) and a dropping ramp waveform voltage to the scan electrodes (SCN1 to SCNn) in a third period following the second period within the setup period. A data electrode driving circuit applies a positive rectangular waveform voltage (Vd) to data electrodes (D1 to Dm) in a period after application of the first positive rectangular waveform voltage (Vs) to the scan electrodes (SCN1 to SCNn) and before application of the negative rectangular waveform voltage (Va) to the scan electrodes (SCN1 to SCNn) in the third period.
Abstract:
A method of designing a semiconductor integrated circuit based on the TPI technique, comprising: (A) selecting a target node from a plurality of nodes included in a design circuit; (B) inserting a test point at the target node; (C) designating a delay time with respect to a test point path that is a path connected to the test point; and (D) laying out the design circuit such that a delay time of the test point path becomes the designated delay time. The (A) selecting includes: (A1) calculating delay times of fan-in paths and fan-out paths with respect to each of the plurality of nodes; and (A2) selecting the target node from the plurality of nodes based on the calculated delay times.
Abstract:
A semiconductor circuit inhibiting the increase in the number of elements required to enable core circuit testing and a core test circuit enabling consecutive-pattern testing of a core circuit without increasing the number of terminals are provided. The semiconductor circuit includes a core circuit, a combinational circuit, a scan path for the combinational circuit with the scan path including cascaded scan flip-flops connected to input and output terminals of the combinational circuit, and scan path sharing circuits including multiplexers for allowing output signals of the core circuit to be inputted to the scan flip-flops, and allows a core circuit not included in the combinational circuit to be tested using the scan path for the combinational circuit. The core test circuit is provided with output shift registers for storing and outputting test results of plural test patterns outputted from output terminals of the core circuit to be eventually scanned out from the output shift registers.
Abstract:
In an evaluation apparatus of a hub unit, a signal processing unit outputs frequency analysis signals which indicate such a result obtained by that an output signal of an acceleration sensor fixed on a hub unit by a magnet is processed via an A/D converting unit and an envelope detecting unit, and thereafter, the processed sensor signal is analyzed for a frequency analysis by an FFT unit. Then, an evaluation output unit evaluates damage conditions of the hub unit based upon signal strengths of specific frequencies, and overall values, which are acquired from the frequency analysis signals, and then, outputs the evaluated damage condition to a display unit.
Abstract:
A two-phase driving operation is performed by a first circuit and a second circuit in at least one sub-field. The first circuit applies a first ramp waveform that drops from a first potential to a second potential to a plurality of first scan electrodes in a setup period, and sequentially applies a scan pulse to the plurality of first scan electrodes in a write period. The second circuit applies a second ramp waveform that drops from the first potential to a third potential that is higher than the second potential to a plurality of second scan electrodes, and then raises the plurality of second scan electrodes to a fourth potential in the setup period, and holds the plurality of second scan electrodes at a fifth potential that is higher than the third potential and lower than the fourth potential in a period where the first scan pulse is applied, and then sequentially applies a scan pulse to the plurality of second electrodes in the write period. Discharge failures during write discharges can be prevented from occurring by employing the two-phase driving operation.