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发明申请
US20100174958A1 Test circuit including tap controller selectively outputting test signal based on mode and shift signals 失效
测试电路包括抽头控制器，选择性地输出基于模式和移位信号的测试信号

Test circuit including tap controller selectively outputting test signal based on mode and shift signals
摘要：
A test circuit includes a plurality of TAP controllers conforming to a standard specification defined in IEEE 1149 and includes a master TAP controller which receives a control code and a test control signal and performs a test on a circuit to be tested and which outputs a shift mode signal, a first slave TAP controller which receives the control code and the test control signal and performs a test on a circuit to be tested, and a first TAP pin control circuit provided to correspond to the first slave TAP controller and which switches between inputting the control code to the first slave TAP controller from the outside and inputting the control code through the master TAP controller, on the basis of the shift mode signal.
摘要（中）：

测试电路包括符合IEEE 1149中定义的标准规范的多个TAP控制器，并且包括主TAP控制器，其接收控制代码和测试控制信号，并对要测试的电路进行测试，并且输出移位模式 信号，第一从属TAP控制器，其接收控制码和测试控制信号并对要测试的电路进行测试;以及第一TAP引脚控制电路，被设置为对应于第一从TAP控制器，并且在第一从属TAP控制器之间进行切换 控制代码从外部到第一从机TAP控制器，并根据移位模式信号通过主TAP控制器输入控制代码。

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