发明申请
- 专利标题: APPEARANCE INSPECTION DEVICE
- 专利标题(中): 外观检查设备
-
申请号: US12602351申请日: 2008-04-25
-
公开(公告)号: US20100188501A1公开(公告)日: 2010-07-29
- 发明人: Motohiro Yagyu , Kenichi Kasai , Ken Sato , Junsuke Yasui , Akira Nagao , Tetsuhisa Ishida
- 申请人: Motohiro Yagyu , Kenichi Kasai , Ken Sato , Junsuke Yasui , Akira Nagao , Tetsuhisa Ishida
- 优先权: JP2007-161613 20070619
- 国际申请: PCT/JP2008/058116 WO 20080425
- 主分类号: H04N7/18
- IPC分类号: H04N7/18
摘要:
An appearance inspection device for inspecting the appearance of test objects, comprising: a first and second conveying means 21 and 22a for conveying the test objects; a back/front reversal means 23 for turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a; a plurality of image-pickup means 30b and 30c for capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a; and a defect detection means for detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect the entire appearance of the test objects.
公开/授权文献
- US08154593B2 Appearance inspection device 公开/授权日:2012-04-10
信息查询