发明申请
US20100190340A1 Methods of forming fine patterns using a nanoimprint lithography
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使用纳米压印光刻形成精细图案的方法
- 专利标题: Methods of forming fine patterns using a nanoimprint lithography
- 专利标题(中): 使用纳米压印光刻形成精细图案的方法
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申请号: US12657750申请日: 2010-01-27
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公开(公告)号: US20100190340A1公开(公告)日: 2010-07-29
- 发明人: Jeong-Hoon Lee , Jeong-Ho Yeo , Joo-On Park , In-Sung Kim , Doo-Hoon Goo , Jin-Hong Park , Chang-Min Park
- 申请人: Jeong-Hoon Lee , Jeong-Ho Yeo , Joo-On Park , In-Sung Kim , Doo-Hoon Goo , Jin-Hong Park , Chang-Min Park
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2009-0006772 20090129
- 主分类号: H01L21/306
- IPC分类号: H01L21/306 ; B29C43/00 ; C23F1/00
摘要:
In a method of forming fine patterns, a photocurable coating layer is formed on a substrate. A first surface of a template makes contact with the photocurable coating layer. The first surface of the template includes at least two first patterns having a first dispersion degree of sizes, and at least one portion of the first surface of the template includes a photo attenuation member. A light is irradiated onto the photocurable coating layer through the template to form a cured coating layer including second patterns having a second dispersion degree of sizes. The second patterns are generated from the first patterns and the second dispersion degree is less than the first dispersion degree. The template is separate from the cured coating layer. A size dispersion degree of the patterns used in a nanoimprint lithography process may be adjusted by the light attenuation member, so that the fine patterns may be formed to have an improved size dispersion degree.
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