发明申请
- 专利标题: Semiconductor Device and Manufacturing Method Therefor
- 专利标题(中): 半导体器件及其制造方法
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申请号: US12693984申请日: 2010-01-26
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公开(公告)号: US20100193923A1公开(公告)日: 2010-08-05
- 发明人: Shigeki Tanaka , Masakazu Sakano , Toshiyuki Shinya , Takafumi Konno , Kazuaki Yoshida , Takashi Sato , Atsushi Fujisawa
- 申请人: Shigeki Tanaka , Masakazu Sakano , Toshiyuki Shinya , Takafumi Konno , Kazuaki Yoshida , Takashi Sato , Atsushi Fujisawa
- 申请人地址: JP Tokyo
- 专利权人: Renesas Technology Corp.
- 当前专利权人: Renesas Technology Corp.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2009-019568 20090130
- 主分类号: H01L23/495
- IPC分类号: H01L23/495 ; H01L21/50 ; H01L21/60
摘要:
The reliability of a semiconductor device is prevented from being reduced. A planar shape of a sealing body is comprised of a quadrangle having a pair of first sides, and a pair of second sides crossing with the first sides. Further, it has a die pad, a controller chip (first semiconductor chip) and a sensor chip (second semiconductor chip) mounted over the die pad, and a plurality of leads arranged along the first sides of the sealing body. The controller chip and the leads are electrically coupled to each other via wires (first wires), and the sensor chip and the controller chip are electrically coupled to each other via wires (second wires). Herein, the die pad is supported by a plurality of suspending leads formed integrally with the die pad and extending from the die pad toward the first sides of the sealing body. Each of the suspending leads has an offset part.
公开/授权文献
- US08466540B2 Semiconductor device and manufacturing method therefor 公开/授权日:2013-06-18
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