发明申请
US20100198549A1 Systems and Methods for Measuring at Least One Thermal Property of Materials Based on a Thermal Bewster Angle 有权
基于散热器角度测量材料的最小热性质的系统和方法

Systems and Methods for Measuring at Least One Thermal Property of Materials Based on a Thermal Bewster Angle
摘要:
One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
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