发明申请
- 专利标题: Systems and Methods for Measuring at Least One Thermal Property of Materials Based on a Thermal Bewster Angle
- 专利标题(中): 基于散热器角度测量材料的最小热性质的系统和方法
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申请号: US12364848申请日: 2009-02-03
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公开(公告)号: US20100198549A1公开(公告)日: 2010-08-05
- 发明人: Mostafa A. Karam , Charles H. Volk , A. Douglas Meyer
- 申请人: Mostafa A. Karam , Charles H. Volk , A. Douglas Meyer
- 主分类号: G01N25/00
- IPC分类号: G01N25/00 ; G06F15/00
摘要:
One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
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