摘要:
One embodiment describes an imaging system. The system includes a first imaging system configured to provide first signals to a target area and to receive first response signals. The system also includes a second imaging system configured to provide second signals to the target area and to receive second response signals. The first and second signals can have separate frequency bands. The system further includes a processor configured to correct the first response signals based on the second response signals, and to generate an image based on the corrected first response signals.
摘要:
A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.
摘要:
One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
摘要:
A sensor system uses ground emitters to illuminate a projectile in flight with a polarized RF beam. By monitoring the polarization modulation of RF signals received from antenna elements mounted on the projectile, both angular orientation and angular rate signals can be derived and used in the inertial solution in place of the gyroscope. Depending on the spacing and positional accuracies of the RF ground emitters, position information of the projectile may also be derived, which eliminates the need for accelerometers. When RF signals of ground emitter/s are blocked from the guided projectile, the sensor deploys another plurality of RF antennas mounted on the projectile nose to determine position and velocity vectors and orientation of incoming targets.
摘要:
A sensor system uses ground emitters to illuminate a projectile in flight with a polarized RF beam. By monitoring the polarization modulation of RF signals received from antenna elements mounted on the projectile, both angular orientation and angular rate signals can be derived and used in the inertial solution in place of the gyroscope. Depending on the spacing and positional accuracies of the RF ground emitters, position information of the projectile may also be derived, which eliminates the need for accelerometers. When RF signals of ground emitter/s are blocked from the guided projectile, the sensor deploys another plurality of RF antennas mounted on the projectile nose to determine position and velocity vectors and orientation of incoming targets.
摘要:
A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.
摘要:
One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
摘要:
An algorithm for a non-redundant multi-error correcting binary differential demodulator simplifies error detection and reduces memory requirements in circuits embodying the same. The demodulator includes a differential detectors (DD) module, an error signal generator (ESG) module, and an error detection-and-correction (EDAC) module. The DD module receives modulated binary input at each of (k+1) differential detectors, each producing (k+1) outputs. The ESG module combines the (k+1)2 output signals with k corrected feedback signals to derive syndromes orthogonal to an erroneous bit to be corrected and generates 2k error signals from the syndromes. The EDAC module generates a correction factor from the 2k error signals and combines the factor with the output of the first order detector delayed by k bits to correct an erroneous bit. The k corrected feedback signals may be derived by successively delaying the corrected erroneous bit. Simplified higher order demodulators may be constructed using a nested hierarchy of lower order demodulators based on the algorithm.
摘要:
One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
摘要:
A method for mitigating multipath impacts on azimuth accuracy in a monopulse interrogator is accomplished by calculating samples of monopulse ratio for samples of antenna boresight angles based on data received from an interrogation of a target. Samples of traditional target azimuth from the samples of monopulse ratio are calculated. A mean of the samples of traditional target azimuth is calculated. An alternative target azimuth from the samples of monopulse ratio is calculated. Whether a multipath signal exists is determined from observing a standard deviation of the samples of traditional target azimuth, and using the mean of the traditional target azimuth if a multipath signal does not exist and using the alternative target azimuth if a multipath signal does exist.