发明申请
US20100227455A1 EPITAXIAL FILM GROWING METHOD, WAFER SUPPORTING STRUCTURE AND SUSCEPTOR 有权
外延膜生长方法,支架结构和阻塞

  • 专利标题: EPITAXIAL FILM GROWING METHOD, WAFER SUPPORTING STRUCTURE AND SUSCEPTOR
  • 专利标题(中): 外延膜生长方法,支架结构和阻塞
  • 申请号: US12682850
    申请日: 2008-11-06
  • 公开(公告)号: US20100227455A1
    公开(公告)日: 2010-09-09
  • 发明人: Takashi FujikawaSeiji Sugimoto
  • 申请人: Takashi FujikawaSeiji Sugimoto
  • 申请人地址: JP Tokyo
  • 专利权人: SUMCO CORPORATION
  • 当前专利权人: SUMCO CORPORATION
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2007-291338 20071108
  • 国际申请: PCT/JP2008/070235 WO 20081106
  • 主分类号: H01L21/20
  • IPC分类号: H01L21/20
EPITAXIAL FILM GROWING METHOD, WAFER SUPPORTING STRUCTURE AND SUSCEPTOR
摘要:
An annular step portion provided to a periphery of a wafer housing portion is provided to an area with which an area of 1 to 6 mm from a boundary line with a chamfered surface of a wafer rear surface toward a wafer center comes in contact. As a result, it is possible to produce an epitaxial wafer having no scratch in a boundary area between the rear surface and the chamfered surface, and to eliminate particles generated due to a scratch in a device process.
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