发明申请
- 专利标题: Ion Beam Detector
- 专利标题(中): 离子束检测器
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申请号: US12223982申请日: 2007-02-14
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公开(公告)号: US20100237239A1公开(公告)日: 2010-09-23
- 发明人: Akira Noda , Yoshihisa Iwashita , Shu Nakamura , Hiroyuki Daido , Satoru Yamada
- 申请人: Akira Noda , Yoshihisa Iwashita , Shu Nakamura , Hiroyuki Daido , Satoru Yamada
- 申请人地址: JP Kyoto JP Chiba-shi, Chiba
- 专利权人: KYOTO UNIVERSITY,NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES
- 当前专利权人: KYOTO UNIVERSITY,NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES
- 当前专利权人地址: JP Kyoto JP Chiba-shi, Chiba
- 优先权: JP2006-038533 20060215
- 国际申请: PCT/JP2007/052645 WO 20070214
- 主分类号: H01J49/40
- IPC分类号: H01J49/40
摘要:
In order to attain an object to realize an ion beam capable of (i) immediately determining energy of the ion beam to be generated, and (ii) measuring an ion beam in real time while carrying out laser irradiation, an ion beam detector (1) of the present invention includes a light conversion section (7) transmitting X-rays mixed in with ions (3) and converting the ions (3) to light; a light detection section (9) detecting, as an electric signal, the light converted from the ions (3) by the light converting section (7); a time-of-flight measurement section (10) measuring a time of flight for the ions (3) to reach the light conversion section (7); an electron removal section (5) removing electrons mixed in with the ions (3) and a light shielding section (6) shielding light mixed in with the ions (3), each of which is provided in an upstream of the light conversion section from which the ion beam comes to the light conversion section; and a curved section (8) between the light conversion section (7) and the light detection section (9), curved with respect to an optical axis of the ions (3) incident on the light conversion section (7).
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