发明申请
- 专利标题： SEMICONDUCTOR DEVICE AND INTERFACE BOARD FOR TESTING THE SAME
- 专利标题（中）： 半导体器件和接口板进行测试
-
申请号： US12495143申请日： 2009-06-30
-
公开(公告)号： US20100244854A1公开(公告)日： 2010-09-30
- 发明人: Khil-Ohk Kang
- 申请人： Khil-Ohk Kang
- 优先权： KR10-2009-0026914 20090330
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A semiconductor device includes a common probing pad; an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages; and a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.
公开/授权文献
信息查询
