发明申请
- 专利标题: METHOD FOR FORMING SILICON DOTS
- 专利标题(中): 形成硅胶的方法
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申请号: US12739982申请日: 2008-10-14
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公开(公告)号: US20100260944A1公开(公告)日: 2010-10-14
- 发明人: Atsushi Tomyo , Hirokazu Kaki , Eiji Takahashi
- 申请人: Atsushi Tomyo , Hirokazu Kaki , Eiji Takahashi
- 优先权: JP2007-281722 20071030
- 国际申请: PCT/JP2008/068929 WO 20081014
- 主分类号: C23C16/505
- IPC分类号: C23C16/505 ; C23C16/24
摘要:
A method for forming silicon dots which can form silicon dots at a relatively low temperature, with good controllability of the particle diameter of silicon dots depending on the particle diameter of silicon dots to be formed.The method for forming silicon dots comprises producing inductively coupled plasma from a gas for forming silicon dots provided within the plasma producing chamber by applying a high-frequency power to an antenna with reduced inductance placed within the plasma producing chamber to form silicon dots on a substrate S disposed within the chamber in the presence of the inductively coupled plasma. Conditions for a pretreatment of the substrate prior to the formation of silicon dots, the temperature of the substrate in forming silicon dots and the gas pressure in the plasma producing chamber during the formation of silicon dots are controlled depending on the particle diameter of the silicon dots.
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