发明申请
- 专利标题: VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- 专利标题(中): 视觉检测设备和视觉检测方法
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申请号: US12681625申请日: 2008-10-01
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公开(公告)号: US20100283847A1公开(公告)日: 2010-11-11
- 发明人: Tetsuro Aikawa , Yoshinori Satoh , Makoto Ochiai , Tatsuya Oodake , Hiroyuki Adachi , Yasuhiro Yuguchi , Junichi Takabayashi
- 申请人: Tetsuro Aikawa , Yoshinori Satoh , Makoto Ochiai , Tatsuya Oodake , Hiroyuki Adachi , Yasuhiro Yuguchi , Junichi Takabayashi
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-259481 20071003; JP2008-126321 20080513; JP2008-139561 20080528
- 国际申请: PCT/JP2008/067860 WO 20081001
- 主分类号: H04N7/18
- IPC分类号: H04N7/18
摘要:
The present invention includes a camera which takes an image of a camera or an inspection target; a device which estimates the movement of the inspection target; a device which generates a high resolution image having a higher resolution than the pixel resolution of a video image taken by the camera from the video image taken by the camera; a device which evaluates the quality of the high resolution image generated by the generation device; and a device which presents an inspector who visually inspects the inspection target with the high resolution image together with the quality evaluation result of the high resolution image. The present invention can improve the reliability of inspection by use of the high resolution image as well as can reduce the inspection time, and further can guarantee the reliability of the inspection using a high resolution image.
公开/授权文献
- US08976242B2 Visual inspection apparatus and visual inspection method 公开/授权日:2015-03-10