发明申请
- 专利标题: DETECTING ELECTRICAL CONDUCTION ABNORMALITIES IN A HEART
- 专利标题(中): 检测心脏电导率异常
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申请号: US12463470申请日: 2009-05-11
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公开(公告)号: US20100286541A1公开(公告)日: 2010-11-11
- 发明人: Shailesh Kumar V. Musley , Vincent E. Splett , Aleksandre T. Sambelashvili
- 申请人: Shailesh Kumar V. Musley , Vincent E. Splett , Aleksandre T. Sambelashvili
- 申请人地址: US MN Minneapolis
- 专利权人: Medtronic, Inc.
- 当前专利权人: Medtronic, Inc.
- 当前专利权人地址: US MN Minneapolis
- 主分类号: A61B5/0452
- IPC分类号: A61B5/0452
摘要:
Techniques are described for detecting conduction abnormalities in a heart of a patient. In particular, an IMD may be configured to obtain electrical signals corresponding to cardiac activity of the heart of the patient and periodically analyze a most recent electrical signal of the obtained electrical signals to detect an electrical conduction abnormality of the heart. The IMD adjusts a frequency at which the most recent electrical signal is analyzed based on at least one physiological parameter of the patient. For example, the IMD may increase the frequency at which the most recent electrical signal is analyzed when a heart rate parameter has significantly changed and the number of detected premature ventricular contractions (PVCs) is greater than or equal to a threshold number. In this manner, the most recent electrical signal is analyzed at a higher frequency in situations in which conduction abnormalities are more likely.
公开/授权文献
- US08391964B2 Detecting electrical conduction abnormalities in a heart 公开/授权日:2013-03-05
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