发明申请
US20100293801A1 LAYERED BEAM MEASUREMENT APPARATUS 有权
分层光束测量装置

LAYERED BEAM MEASUREMENT APPARATUS
摘要:
A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.
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