发明申请
- 专利标题: LAYERED BEAM MEASUREMENT APPARATUS
- 专利标题(中): 分层光束测量装置
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申请号: US12770569申请日: 2010-04-29
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公开(公告)号: US20100293801A1公开(公告)日: 2010-11-25
- 发明人: Brian Lamb , David Titzler , Heather Fleming
- 申请人: Brian Lamb , David Titzler , Heather Fleming
- 主分类号: G01B3/10
- IPC分类号: G01B3/10
摘要:
A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.
公开/授权文献
- US08033033B2 Layered beam measurement apparatus 公开/授权日:2011-10-11
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