发明申请
- 专利标题: High throughput inspecting
- 专利标题(中): 高通量检测
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申请号: US11519199申请日: 2006-09-12
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公开(公告)号: US20100294927A1公开(公告)日: 2010-11-25
- 发明人: Michael Nelson , Sylvain Cruchon-Dupeyrat , Bjoern Rosner , Cedric Loiret-Bernal
- 申请人: Michael Nelson , Sylvain Cruchon-Dupeyrat , Bjoern Rosner , Cedric Loiret-Bernal
- 专利权人: Nanolnk, Inc.
- 当前专利权人: Nanolnk, Inc.
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; A61K9/44 ; G06F19/00 ; G01N1/02
摘要:
The various embodiments provide methods and apparatus high-throughput reading and decoding of information-encoding features (especially identification features) on pharmaceutical compositions for the purpose of e.g. counterfeiting detection and inventory tracking/tracing. A preferred embodiment provides high-throughput imaging of regular arrays of pharmaceutical tablets with a scanning electron microscope. Another preferred embodiment provides video-rate scanning probe imaging of pharmaceutical compositions and especially atomic force microscopy imaging thereof.
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