发明申请
- 专利标题: FIELD EFFECT TRANSISTOR WITH NARROW BANDGAP SOURCE AND DRAIN REGIONS AND METHOD OF FABRICATION
- 专利标题(中): 具有窄带源和漏区的场效应晶体管和制造方法
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申请号: US12850582申请日: 2010-08-04
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公开(公告)号: US20100295129A1公开(公告)日: 2010-11-25
- 发明人: Robert S. Chau , Suman Datta , Jack Kavalieros , Justin K. Brask , Mark L. Doczy , Matthew Metz
- 申请人: Robert S. Chau , Suman Datta , Jack Kavalieros , Justin K. Brask , Mark L. Doczy , Matthew Metz
- 主分类号: H01L29/786
- IPC分类号: H01L29/786
摘要:
A transistor having a narrow bandgap semiconductor source/drain region is described. The transistor includes a gate electrode formed on a gate dielectric layer formed on a silicon layer. A pair of source/drain regions are formed on opposite sides of the gate electrode wherein said pair of source/drain regions comprise a narrow bandgap semiconductor film formed in the silicon layer on opposite sides of the gate electrode.
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