发明申请
- 专利标题: SAMPLE OBSERVATION SYSTEM AND SAMPLE OBSERVATION PROCESS
- 专利标题(中): 样本观测系统和样本观测过程
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申请号: US12788136申请日: 2010-05-26
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公开(公告)号: US20100302534A1公开(公告)日: 2010-12-02
- 发明人: Kohei Watanabe , Tsuyoshi Nomoto , Takeshi Miyazaki , Toshio Tanaka , Yasuhito Shimada
- 申请人: Kohei Watanabe , Tsuyoshi Nomoto , Takeshi Miyazaki , Toshio Tanaka , Yasuhito Shimada
- 申请人地址: JP Tokyo
- 专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人地址: JP Tokyo
- 优先权: JP2009-131628 20090529
- 主分类号: G01N1/10
- IPC分类号: G01N1/10
摘要:
A sample observation system and a sample observation process are provided which do not need any special manipulation or treatment to limit the motion of the sample or adjust the orientation of the sample when observing the sample, and enable observation of samples simply from wider direction than ever. A sample observation system of a sample whose vertical direction is defined by gravity, wherein the system at least includes a sample holder having at least one penetrating hole for retaining a liquid containing the sample; an observation unit for observing the sample; and an angle adjusting unit for varying the angle of the observation unit to the direction of the gravity which acts on the sample in a condition in which the sample holder and the observation unit have a fixed relative angle therebetween.
公开/授权文献
- US08243266B2 Sample observation system and sample observation process 公开/授权日:2012-08-14
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