发明申请
- 专利标题: SYSTEM FOR OPERATING DIFFERENTIAL PROBE
- 专利标题(中): 操作差分探测系统
-
申请号: US12546703申请日: 2009-08-25
-
公开(公告)号: US20100308798A1公开(公告)日: 2010-12-09
- 发明人: SHEN-CHUN LI , SHOU-KUO HSU
- 申请人: SHEN-CHUN LI , SHOU-KUO HSU
- 申请人地址: TW Taipei Hsien
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: TW Taipei Hsien
- 优先权: CN200910302928.4 20090604
- 主分类号: G01R1/06
- IPC分类号: G01R1/06
摘要:
A system for operating a differential probe which includes a first metal extension and a second metal extension having the same structures is disclosed. Each of the metal extensions includes a rotatable arm, a rotatable base, and a contact end. The rotatable base and contact end of each of the metal extensions extend from two ends of the corresponding rotatable arm at an angle, the contact ends and the rotatable bases of the metal extensions are parallel to each other. The system controls a mechanical arm to adjust a vertical distance between the contact ends to be equal to a required vertical distance by rotating the first metal extension around the rotatable base of the second metal extension clockwise by a rotated angle, and rotating the second metal extension around the rotatable base of the first metal extension counterclockwise by the rotated angle.
公开/授权文献
- US08089267B2 System for operating differential probe 公开/授权日:2012-01-03
信息查询