发明申请
- 专利标题: LOW-K INTERLEVEL DIELECTRIC MATERIALS AND METHOD OF FORMING LOW-K INTERLEVEL DIELECTRIC LAYERS AND STRUCTURES
- 专利标题(中): 低K电介质材料和低K电介质层和结构的形成方法
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申请号: US12857633申请日: 2010-08-17
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公开(公告)号: US20100311895A1公开(公告)日: 2010-12-09
- 发明人: Geraud Jean-Michel Dubois , James Lupton Hedrick , Ho-Cheol Kim , Victor Yee-Way Lee , Teddie Peregrino Magbitang , Robert Dennis Miller , Muthumanickam Sankarapandian , Linda Karin Sundberg , Willi Volksen
- 申请人: Geraud Jean-Michel Dubois , James Lupton Hedrick , Ho-Cheol Kim , Victor Yee-Way Lee , Teddie Peregrino Magbitang , Robert Dennis Miller , Muthumanickam Sankarapandian , Linda Karin Sundberg , Willi Volksen
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: C08L83/06
- IPC分类号: C08L83/06 ; C08L83/04
摘要:
A composition of matter and a structure fabricated using the composition. The composition comprising: a resin; polymeric nano-particles dispersed in the resin, each of the polymeric nano-particle comprising a multi-arm core polymer and pendent polymers attached to the multi-arm core polymer, the multi-arm core polymer immiscible with the resin and the pendent polymers miscible with the resin; and a solvent, the solvent volatile at a first temperature, the resin cross-linkable at a second temperature, the polymeric nano-particle decomposable at a third temperature, the third temperature higher than the second temperature, the second temperature higher than the first temperature, wherein a thickness of a layer of the composition shrinks by less than about 3.5% between heating the layer from the second temperature to the third temperature.
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