发明申请
- 专利标题: X-RAY DETECTOR FOR PHASE CONTRAST IMAGING
- 专利标题(中): 用于相位对比成像的X射线探测器
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申请号: US12866744申请日: 2009-02-09
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公开(公告)号: US20100322380A1公开(公告)日: 2010-12-23
- 发明人: Christian Baeumer , Klaus Juergen Engel , Christoph Herrmann
- 申请人: Christian Baeumer , Klaus Juergen Engel , Christoph Herrmann
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP08151430.9 20080214
- 国际申请: PCT/IB09/50519 WO 20090209
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; G01J1/00
摘要:
The invention relates to an X-ray detector (30) that comprises an array of sensitive elements (Pi−1,b, Pia, Pib, Pi+1,a, Pi+1,b) and at least two analyzer gratings (G2a, G2b) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (IIi) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector (30) can particularly be applied in an X-ray device (100) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.
公开/授权文献
- US08576983B2 X-ray detector for phase contrast imaging 公开/授权日:2013-11-05