发明申请
US20110002813A1 ANALYSIS METHOD, ANALYSIS DEVICE AND PRODUCTION METHOD THEREFOR 审中-公开
分析方法,分析装置及其生产方法

  • 专利标题: ANALYSIS METHOD, ANALYSIS DEVICE AND PRODUCTION METHOD THEREFOR
  • 专利标题(中): 分析方法,分析装置及其生产方法
  • 申请号: US12880604
    申请日: 2010-09-13
  • 公开(公告)号: US20110002813A1
    公开(公告)日: 2011-01-06
  • 发明人: Hideki TANJI
  • 申请人: Hideki TANJI
  • 申请人地址: JP Kyoto-shi
  • 专利权人: ARKRAY, INC.
  • 当前专利权人: ARKRAY, INC.
  • 当前专利权人地址: JP Kyoto-shi
  • 优先权: JP2002-294448 20021008
  • 主分类号: G01N21/00
  • IPC分类号: G01N21/00 H05K13/00
ANALYSIS METHOD, ANALYSIS DEVICE AND PRODUCTION METHOD THEREFOR
摘要:
The present invention relates to a technique for analyzing the concentration of a specific component in a sample liquid, such as a method for analyzing a sample. The analyzing method includes a first detection step for irradiating light from a light source (50) onto a reaction system to detect a response from the reaction system (56) as a first detection result. The reaction system contains a sample liquid and a reagent. The method also includes a second detection step for irradiating light onto a reference board (54) to detect a response from the reference board as a second detection result. The response from the reference board under light irradiation is dependent on wavelength. The method further includes a calculation step for calculating the concentration of the specific component in the sample liquid based on the first and second detection results.
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