发明申请
US20110006780A1 ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE
有权
有源矩阵基板,显示装置,检测有源矩阵基板的方法以及检查显示装置的方法
- 专利标题: ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE
- 专利标题(中): 有源矩阵基板,显示装置,检测有源矩阵基板的方法以及检查显示装置的方法
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申请号: US12920857申请日: 2009-03-13
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公开(公告)号: US20110006780A1公开(公告)日: 2011-01-13
- 发明人: Kazunori Tanimoto , Isao Ogasawara , Masahiro Yoshida , Takehiko Kawamura , Hideaki Takizawa
- 申请人: Kazunori Tanimoto , Isao Ogasawara , Masahiro Yoshida , Takehiko Kawamura , Hideaki Takizawa
- 优先权: JP2008-066479 20080314
- 国际申请: PCT/JP2009/054898 WO 20090313
- 主分类号: G01R31/04
- IPC分类号: G01R31/04 ; G09G3/20 ; G09G3/36
摘要:
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).