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    ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE
    1.
    发明申请
    ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY DEVICE 有权
    有源矩阵基板，显示装置，检测有源矩阵基板的方法以及检查显示装置的方法

    公开(公告)号：US20110006780A1

    公开(公告)日：2011-01-13

    申请号：US12920857

    申请日：2009-03-13

    申请人： Kazunori Tanimoto ,  Isao Ogasawara ,  Masahiro Yoshida ,  Takehiko Kawamura ,  Hideaki Takizawa

    发明人： Kazunori Tanimoto ,  Isao Ogasawara ,  Masahiro Yoshida ,  Takehiko Kawamura ,  Hideaki Takizawa

    IPC分类号： G01R31/04 ,  G09G3/20 ,  G09G3/36

    CPC分类号： G01R31/045 ,  G02F1/1345 ,  G02F1/136286 ,  G02F2001/13456 ,  G02F2001/136254

    摘要： Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).

    摘要翻译： 提供一种具有改进的显示质量的有源矩阵基板，而不在端子排列区域中形成检查线，用于检查连接线之间的短路。 扫描线（40）包括在一端侧具有用于扫描信号的输入端的第一扫描线和具有用于扫描信号的另一端侧的输入端的第二扫描线。 在显示区域（4）中，第一扫描线和第二扫描线交替地一个一个地形成。 有源矩阵基板（2）包括跨越多个第一连接线（61）中的每一条的第一检查线（70）和第二检查线（72），以及第三检查线（75）和第四检查线 （77），其跨越多个第二连接线（64）中的每一个。 第一至第四检查线（70,72,75,77）形成在除端子排列区域（5）和显示区域（4）之外的框状布线区域（6）中。

    Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device
    2.
    发明授权
    Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device 有权
    有源矩阵基板，显示装置，有源矩阵基板检查方法以及显示装置的检查方法

    公开(公告)号：US08653827B2

    公开(公告)日：2014-02-18

    申请号：US12920857

    申请日：2009-03-13

    申请人： Kazunori Tanimoto ,  Isao Ogasawara ,  Masahiro Yoshida ,  Takehiko Kawamura ,  Hideaki Takizawa

    发明人： Kazunori Tanimoto ,  Isao Ogasawara ,  Masahiro Yoshida ,  Takehiko Kawamura ,  Hideaki Takizawa

    IPC分类号： G01R31/04

    CPC分类号： G01R31/045 ,  G02F1/1345 ,  G02F1/136286 ,  G02F2001/13456 ,  G02F2001/136254

    摘要： Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).

    摘要翻译： 提供一种具有改进的显示质量的有源矩阵基板，而不在端子排列区域中形成检查线，用于检查连接线之间的短路。 扫描线（40）包括在一端侧具有用于扫描信号的输入端的第一扫描线和具有用于扫描信号的另一端侧的输入端的第二扫描线。 在显示区域（4）中，第一扫描线和第二扫描线交替地一个一个地形成。 有源矩阵基板（2）包括跨越多个第一连接线（61）中的每一条的第一检查线（70）和第二检查线（72），以及第三检查线（75）和第四检查线 （77），其跨越多个第二连接线（64）中的每一个。 第一至第四检查线（70,72,75,77）形成在除端子排列区域（5）和显示区域（4）之外的框状布线区域（6）中。

    Active matrix substrate, display device, and active matrix substrate inspecting method
    10.
    发明授权
    Active matrix substrate, display device, and active matrix substrate inspecting method 有权
    有源矩阵基板，显示装置和有源矩阵基板检测方法

    公开(公告)号：US07847577B2

    公开(公告)日：2010-12-07

    申请号：US12376045

    申请日：2007-03-12

    申请人： Masahiro Yoshida ,  Kazunori Tanimoto ,  Yasuhiro Mimura

    发明人： Masahiro Yoshida ,  Kazunori Tanimoto ,  Yasuhiro Mimura

    IPC分类号： G01R31/00

    CPC分类号： G09G3/006 ,  G02F1/1345 ,  G02F1/13458 ,  G02F1/136286 ,  G02F2001/136254 ,  G02F2203/69 ,  G09G3/3225 ,  G09G3/3648 ,  G09G2300/0426 ,  H01L27/3276

    摘要： By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.

    摘要翻译： 通过将检测信号彼此独立地馈送到上部第一和第二栅极引线检查线（52b，52c），同时保持上部栅极侧开关元件（40c）处于导通状态，相邻栅极线之间的任何短路 可以检测上部栅极线（40）等的40°。 通过彼此独立地馈送检查信号，分别降低第一和第二栅极引线检查线（53b，53c），同时保持下部栅极侧开关元件（40c'）处于导通状态，相邻栅极线之间的任何短路 可以检测下部栅极线（40）等的40°。 通过将检测信号彼此独立地馈送到源极检测线（55），同时将源极侧开关元件（41）保持在导通状态，可以检测相邻源极线（41）之间的任何短路等。