Provided is a test apparatus that tests a device under test, comprising a power supply that generates power supplied to the device under test; a transmission path that transmits the power generated by the power supply to the device under test; a current measuring section that measures a peak in current supplied to the device under test via the transmission path, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential; and a judging section that judges acceptability of the device under test based on the peak measured by the current measuring section.